SUNYU Photonics - Precision Testing Solutions
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Is inefficient PIC testing holding you back?

With the increasing demand for faster and more efficient data transmission in modern society, photonic technology has become increasingly important in fields such as communications, data processing, and sensing. Photonic Integrated Circuit (PIC) technology, which integrates multiple optical or optoelectronic devices on a single chip, is emerging as a key solution to meet this demand. It not only significantly improves data transmission speed and bandwidth but also greatly reduces power consumption and costs, driving rapid developments across data centers, 5G networks, artificial intelligence, and the Internet of Things.

The rapid rise of PIC technology is attributed to its unique advantages. Firstly, it achieves highly compact designs by integrating multiple functional devices on a single chip, thereby reducing the size and weight of the equipment. Secondly, PIC technology demonstrates excellent performance in high-speed transmission and processing of large amounts of data, effectively addressing the challenges of modern data-intensive applications. Additionally, the manufacturing process of integrated photonic devices is compatible with existing semiconductor processes, facilitating large-scale production and commercialization.Unlock the full potential of your silicon photonics (PIC) testing with our state-of-the-art wafer-level edge coupling automated probe station. Designed to address the most demanding requirements, our solution guarantees unmatched precision, stability, and throughput. Here’s how we can transform your PIC testing capabilities:

Understand & overcome the challenges of wafer-level edge coupling automation

High Precision and High Speed Requirements

High Precision:Silicon photonics wafer-level testing requires coupling alignment on the wafer, especially for edge coupling technology, where fiber arrays need to be inserted into tiny trench between chips for coupling. This demands extremely high system precision, with alignment accuracy needing to reach sub-micron or even nanometer levels.

High Speed:As the scale and complexity of silicon photonic devices increase, fully automated fast testing solutions are needed to meet large-scale production demands.

Complex Testing Requirements

Optical Alignment:Photonic devices require precise optical alignment, and micrometer-level misalignment can lead to inaccurate test results, significantly higher than the requirements for traditional electronic probe stations.

Multi-parameter Testing:Silicon photonic devices typically require multiple parameter tests, such as Insertion Loss (IL), Polarization Dependent Loss (PDL), current-voltage curves (I-V Curve), bandwidth, and eye diagrams, increasing the complexity of testing.

Diverse Device Structures

Diversity:There is a wide variety of silicon photonic devices, including photodetectors, modulators, waveguides, and optical splitters, each with different testing methods and standards.

Integration:As device integration increases, testing needs to cover more functions and more complex electro-optical components.

Data Processing and Analysis

Large Amounts of Data:Silicon photonic device testing generates a large amount of data, requiring efficient data processing and analysis capabilities to quickly identify and address issues.

Data Accuracy:Ensuring data accuracy and consistency to guarantee the reliability of test results.

Automation Level

Automation: Increasing the level of automation in the testing process to reduce human error and improve testing efficiency.

Flexibility: Testing systems need to be flexible enough to adapt to different types of silicon photonic devices and testing requirements.

Cost Control

Testing Costs:Silicon photonics wafer testing equipment and processes are costly, requiring cost-effective solutions.

Time Costs:The testing process is time-consuming, necessitating optimization of the testing process to shorten test time.

Environmental Interference

Environmental Stability:The testing environment needs to remain highly stable to avoid external interference affecting the test results, such as vibration and temperature fluctuations.

Software / Hardware Integration Testing Experience

Addressing these challenges requires advanced testing technology and equipment, highly specialized automation control software, and extensive experience in test system integration. Sunyu Photonics is committed to helping customers overcome these challenges by providing high-precision, high-speed, and automated testing solutions, improving the efficiency and quality of silicon photonic device testing.


Navigo软件

High-precision Four-axis Wafer Stage:Precise positioning movement in X, Y, Z and RZ (rotation) directions. This equipment can be configured with 12-inch and 8-inch wafers, and is backward compatible with bar strips, multi-chips and single chips, suitable for various wafer testing needs. Its high-precision positioning function ensures accuracy and reliability at every step in the test process, thereby improving the consistency and accuracy of test results.

Optical-Probe Positioner:Realize true independent six-axis control in XYZ, RX, RY, and RZ directions to achieve three-dimensional free-space optical coupling. This system allows independent control on multiple axes, making the fiber alignment and coupling process more precise and efficient. Whether it is complex three-dimensional optical path adjustment or multi-dimensional optical testing, the fiber probe six-axis table can provide a stable and efficient solution.

Electrical (including RF) Probe Positioner:It provides X, Y, Z and rotation adjustment functions, and supports both automatic and manual operation modes. This system can flexibly adapt to various electrical and RF test needs, not only improving the efficiency and accuracy of the test, but also providing reliable performance in different test environments. The automated operation options make the test process more convenient and efficient, reducing human intervention and errors.

Vision System:Our vision system includes top and side vision displays and adjustment tables, which work with Sunyu's software system to form a powerful visual intelligence system. With the integrated vision system, users can monitor and adjust every detail of the test process in real time, ensuring high-precision results for each test. The intelligent vision system also has autofocus and image recognition functions, which further improves the efficiency and accuracy of the test.

Our probe stations are equipped with industry-leading positioning and motion control technology to ensure highly accurate and repeatable results during the test process. Whether it is high-precision wafer displacement or complex fiber alignment operations, our equipment can handle it. The integration of the visual system allows each step of the test process to be accurately monitored and adjusted to ensure the reliability of the test results.

Navigo软件

Precise Positioning and Motion Control:Sunyu systems use the most advanced positioning and motion control technology to ensure excellent accuracy, repeatability and fast automation for unparalleled performance. Our systems are capable of precise positioning at the sub-micron level, ensuring that every test step meets high standards of accuracy. This high-precision control technology is particularly important in complex optoelectronic tests, which can significantly improve the reliability and consistency of test results.

Modular Design:Sunyu systems have a scalable and highly customizable modular design that provides seamless adaptability. They can be easily reconfigured at the hardware level to accommodate a variety of electrical, optical, and RF probe combinations to meet specific test needs. This modular design not only improves the flexibility of the system, but also enables users to upgrade and adjust the system according to actual needs, ensuring that the system always maintains the best working condition.

24/7 Automated Operation:Sunyu systems provide powerful and reliable automated operation around the clock, following strict industrial standards. Our systems are capable of unattended wafer-level test automation, maintaining high accuracy and repeatability for long periods of time (even for more than several days). Automated operation not only improves test efficiency and accuracy, but also reduces the time and cost of manual operation, making large-scale testing more economical and efficient.

Sunyu's probe stations and test solutions have significant advantages in accuracy, flexibility and automation. We are committed to providing customers with the most advanced test technologies and services to help them achieve more efficient and reliable PIC testing. Through continuous innovation and technology optimization, our systems not only meet current test needs, but are also fully prepared for future test challenges.

Navigo软件

Highly Flexible and Scalable Architecture:Navigo can flexibly control the entire system, including stages, probes, vision systems, and various test instruments, making it the core of fully automated wafer testing. Our open architecture seamlessly integrates with any third-party equipment, easily adapting to current and future diverse and complex testing requirements with high flexibility.

Low-Code Platform: Due to the complexity of silicon photonics testing, fully automated testing requires writing very complex test sequences and plans. Navigo transforms complex test sequence coding tasks into a simple graphical low-code platform. It allows easy calling of various test instruments and devices, and stores commonly used test sequences for reuse. This enables test engineers to quickly complete test sequence setup, reducing human errors and significantly reducing debugging time. It also greatly reduces the coding skill requirements for test engineers, enabling engineers to quickly become proficient programmers.

Proprietary Algorithms:Navigo includes proprietary algorithms for fully automated wafer testing, including wafer positioning, device navigation, fiber alignment, probe calibration, pivot point, and thermal compensation. These advanced algorithms ensure high precision and high repeatability in wafer testing.

Intelligent Vision System:Navigo's unique intelligent vision system interacts with the entire testing system, featuring advanced machine vision to ensure real-time accurate measurements and error calibration.

Data Analysis:Navigo has powerful data analysis capabilities, making test results visual and facilitating professional analysis and organization. Test results can be used not only to determine whether the device under test is qualified but also to provide feedback on the chip manufacturing process, further improving production yield.

Standard Industrial Interfaces:Navigo supports standard industrial protocols and open API interfaces, allowing users to easily integrate our testing system into their existing systems or for secondary development.

The flexibility and powerful functions of Navigo software make fully automatic PIC testing more efficient and reliable. By integrating advanced algorithms and intelligent vision systems, Navigo can not only accurately control the test process, but also provide detailed data analysis to provide strong support for production optimization.

Navigo软件

Sunyu's wafer-level automated testing solutions integrate advanced technology's high-precision probe stations and various optoelectronic test instruments and instruments through Navigo's control, making our entire system solution a leader in the industry. Our advantages include:

Automated Wafer-Level PIC Testing:Sunyu systems achieve efficient and reliable PIC full wafer automated testing processes, adaptable to 12-inch and 8-inch full wafers, as well as multi-die and single-die, providing flexibility to meet various testing requirements.

High-precision Coupling:Sunyu systems can perform efficient and precise edge coupling and grating coupling for photonic devices. Notably, wafer-level edge coupling poses a greater challenge, requiring higher motion control precision and control software algorithms. Sunyu is a pioneer in achieving full wafer edge coupling in the industry.

Comprehensive Optical, Electrical, and RF Parameter Testing:Sunyu testing systems can be integrated with various optoelectronic test instruments to comprehensively achieve optical-optical (OO), optical-electrical (OE), electrical-optical (EO), and RF parameter testing for both passive and active photonic devices, covering a wide range of PIC applications and requirements.

Cost efficiency:Sunyu's wafer-level fully automated solution effectively overcomes the expensive and time-consuming bottlenecks of PIC testing, significantly enhancing chip testing efficiency and accuracy, thereby contributing to users' cost control.

Sunyu's probe station and test solutions not only have significant advantages in technology, but also provide users with strong support in cost-effectiveness and operational convenience. Through innovative technology and perfect service, we are committed to helping customers achieve more efficient and reliable PIC testing.
Contact Us now and receive a free evaluation for your wafer-level test ande see our automated probe station in action. Experience firsthand the precision, efficiency, and reliability that sets our solution apart. Don’t miss out on this opportunity to elevate your PIC testing capabilities. Reach out to us now and take the first step towards unparalleled testing efficiency and accuracy!