
Sunyu Photonics Private Limited is a startup technology company focused on the development of integrated PIC testing solutions. Established in 2019 in Singapore, the team consists of industry innovators with deep expertise in electronics, photonics, optoelectronics, automation, AI, and systems theory. Through interactions with customers and collaborators, we have gained a profound understanding of the high costs associated with PICs in the silicon photonics integrated circuit industry chain. To address this industry challenge, after several years of research and development, Sunyu Photonics successfully developed a high-stability, high-reliability automated wafer-level Edge Coupling PIC testing probe station. This probe station provides fast accurate numerical and graphical results for silicon photonic wafers from design to production, significantly reducing costs and saving time for customers. Sunyu Photonics will continue to stay at the forefront of technology, consistently launching products that meet customer needs.
As experts in comprehensive testing system solutions, Sunyu has over a decade of expertise in photonic integrated circuit testing, industrial automation, high-precision motion control, software development, and wafer-level test system integration and customization. Sunyu is committed to providing tailored turnkey solutions to address the growing complexity of PIC testing requirements, with rich experience and capabilities in system customizations.

With the increasing demand for faster and more efficient data transmission in modern society, photonic technology has become increasingly important in fields such as communications, data processing, and sensing. Photonic Integrated Circuit (PIC) technology, which integrates multiple optical or optoelectronic devices on a single chip, is emerging as a key solution to meet this demand. It not only significantly improves data transmission speed and bandwidth but also greatly reduces power consumption and costs, driving rapid developments across data centers, 5G networks, artificial intelligence, and the Internet of Things.
The rapid rise of PIC technology is attributed to its unique advantages. Firstly, it achieves highly compact designs by integrating multiple functional devices on a single chip, thereby reducing the size and weight of the equipment. Secondly, PIC technology demonstrates excellent performance in high-speed transmission and processing of large amounts of data, effectively addressing the challenges of modern data-intensive applications. Additionally, the manufacturing process of integrated photonic devices is compatible with existing semiconductor processes, facilitating large-scale production and commercialization.

High Precision and High Speed Requirements
High Precision:Silicon photonics wafer-level testing requires coupling alignment on the wafer, especially for edge coupling technology, where fiber arrays need to be inserted into tiny trench between chips for coupling. This demands extremely high system precision, with alignment accuracy needing to reach sub-micron or even nanometer levels.
High Speed:As the scale and complexity of silicon photonic devices increase, fully automated fast testing solutions are needed to meet large-scale production demands.
Complex Testing Requirements
Optical Alignment:Photonic devices require precise optical alignment, and micrometer-level misalignment can lead to inaccurate test results, significantly higher than the requirements for traditional electronic probe stations.
Multi-parameter Testing:Silicon photonic devices typically require multiple parameter tests, such as Insertion Loss (IL), Polarization Dependent Loss (PDL), current-voltage curves (I-V Curve), bandwidth, and eye diagrams, increasing the complexity of testing.
Diverse Device Structures
Diversity:There is a wide variety of silicon photonic devices, including photodetectors, modulators, waveguides, and optical splitters, each with different testing methods and standards.
Integration:As device integration increases, testing needs to cover more functions and more complex electro-optical components.
Data Processing and Analysis
Large Amounts of Data:Silicon photonic device testing generates a large amount of data, requiring efficient data processing and analysis capabilities to quickly identify and address issues.
Data Accuracy:Ensuring data accuracy and consistency to guarantee the reliability of test results.
Automation Level
Automation: Increasing the level of automation in the testing process to reduce human error and improve testing efficiency.
Flexibility: Testing systems need to be flexible enough to adapt to different types of silicon photonic devices and testing requirements.
Cost Control
Testing Costs:Silicon photonics wafer testing equipment and processes are costly, requiring cost-effective solutions.
Time Costs:The testing process is time-consuming, necessitating optimization of the testing process to shorten test time.
Environmental Interference
Environmental Stability:The testing environment needs to remain highly stable to avoid external interference affecting the test results, such as vibration and temperature fluctuations.
Software / Hardware Integration Testing Experience
Addressing these challenges requires advanced testing technology and equipment, highly specialized automation control software, and extensive experience in test system integration. Sunyu Photonics is committed to helping customers overcome these challenges by providing high-precision, high-speed, and automated testing solutions, improving the efficiency and quality of silicon photonic device testing.