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E-PhAuto Series

Integrated Solution (Hardware with Software)

A turn-key solution for automated integrated photonics tests
  • High scalability from Die-level to wafer-scale probe stations (up to 300-mm wafers)
  • Support edge and surface coupling
  • Ultra-fast navigation with nanoscale optical alignment
  • Fully automated electronic-photonic test for high-throughput operation
  • User-friendly operating system enhanced with integration of advanced electrical and optical instruments
  • Seamless integration with an existing data platform or EVHA’s E-Tensor

E-Aero Series

Integrated Solution (Hardware with Software)

A test-packaging all-in-one system
  • Complete wafer, die, sub-assembly and package testing capacity, including electro-optical RF
  • Fully reconfigurable for fabrication, processing, sorting
  • Direct production transfer
  • Shareable, unique software, unique capabilities
  • Perfect for process development and product prototyping

E-Tensor Software

Software Product

An intelligent platform for test automation, data management and analysis using 7 approaches
  • Unified software system for various scales ranging from single dies to 300-mm wafers
  • Easy definition of test sequence enabling complex tasks
  • Management of mega data
  • Assistance in information extraction and presentation
  • Efficient data access and sharing within a team and through the production line
  • High compatibility and scalability
  • System upgrades and expansion support provided